Antenas de Teste para Medição de Campo Próximo Siglent SFR5030

It is suitable for measurements up to 3 cm. Interference sources can be localized by detecting the distribution and orientation of the field, therefore enabling a more exact use of higher resolution probes.

It is suitable for measurements up to 3 cm. Interference sources can be localized by detecting the distribution and orientation of the field, therefore enabling a more exact use of higher resolution probes.

It is designed for the detection of magnetic fields which are emitted vertically from the surface of PCBs and is thus ideal for investigating current loops. The probe allows the measurement in confined board areas (between large controller components, for example - resolution approx. 2 mm).